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SSBDDs and double topology for multiple fault reasoning

author
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
source
Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012
location of publication
[S.l.]
publisher
IEEE Computer Society
year of publication
2012
pages
p. 23-28
conference name, date
10th IEEE East-West Design & Test Symposium (EWDTS), September 14-17, 2012
conference location
Kharkov, Ukraine
language
inglise
Ubar, R., Kostin, S., Raik, J. SSBDDs and double topology for multiple fault reasoning // Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012. [S.l.] : IEEE Computer Society, 2012. p. 23-28.