SSBDDs and double topology for multiple fault reasoning
                                            statement of authorship
                                    
                                    
Raimund Ubar, Sergei Kostin, Jaan Raik
                                                    
                                            
                                            location of publication
                                    
                                    
[S.l.]
                                                    
                                            
                                            publisher
                                    
                                    
                                
                                            year of publication
                                    
                                    
                                
                                            pages
                                    
                                    
p. 23-28
                                                    
                                            
                                            conference name, date
                                    
                                    
10th IEEE East-West Design & Test Symposium (EWDTS), September 14-17, 2012
                                                    
                                            
                                            conference location
                                    
                                    
Kharkov, Ukraine
                                                    
                                            
                                            language
                                    
                                    
inglise
                                                    
                                            
                                            subject term
                                    
                                    
                                
                            Ubar, R., Kostin, S., Raik, J. SSBDDs and double topology for multiple fault reasoning // Proceedings of IEEE East-West Design & Test Symposium (EWDTS’2012) : Kharkov, Ukraine, September 14–17, 2012. [S.l.] : IEEE Computer Society, 2012. p. 23-28.