Low-temperature annealing of lightly doped n-4H-SiC layers after irradiation with fast electrons
author
Korolkov, Oleg
Kozlovski, Vitali V.
Lebedev, Alexander A.
Sleptšuk, Natalja
Toompuu, Jana
Rang, Toomas
statement of authorship
O.M. Korolkov, V.V. Kozlovski, A.A. Lebedev, N. Sleptsuk, J. Toompuu, T. Rang
source
Semiconductors
publisher
Pleiades Publishing
journal volume number month
vol. 53, 7
year of publication
2019
pages
p. 975−978
url
https://doi.org/10.1134/S1063782619070133
subject term
temperatuuri toime
ränikarbiid
elektronid
ISSN
1063-7826
notes
Bibliogr.: 14 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/29834
https://www.scopus.com/record/display.uri?eid=2-s2.0-85068585613&origin=inward&txGid=3377015e7d50ef7770bff2c1af848b0e
WOS
https://jcr.clarivate.com/jcr-jp/journal-profile?journal=SEMICONDUCTORS%2B&year=2022
https://www.webofscience.com/wos/woscc/full-record/WOS:000474481600021
category (general)
Physics and astronomy
Füüsika ja astronoomia
Materials science
Materjaliteadus
category (sub)
Physics and astronomy. Condensed matter physics
Füüsika ja astronoomia. Kondenseeritud aine füüsika
Materials science. Electronic, optical and magnetic materials
Materjaliteadus. Elektroonilised, optilised ja magnetilised materjalid
Physics and astronomy. Atomic and molecular physics, and optics
Füüsika ja astronoomia. Aatomi- ja molekulaarfüüsika ning optika
quartile
Q2
TalTech department
Thomas Johann Seebecki elektroonikainstituut
language
inglise
Reserch Group
Cognitronic lab-on-a-chip research group
Research laboratory for cognitronics