Phase composition of selenized Cu2ZnSnSe4 thin films determined by X-ray diffraction and Raman spectroscopy
author
statement of authorship
M. Ganchev, J. Iljina, L. Kaupmees, T. Raadik, O. Volobujeva, A. Mere, M. Altosaar, J. Raudoja, E. Mellikov
source
journal volume number month
Vol. 519, 21
year of publication
pages
p. 7394-7398 : ill
ISSN
0040-6090
notes
Bibliogr.: 14 ref
language
inglise
Ganchev, M., Iljina, J., Kaupmees, L., Raadik, T., Volobujeva, O., Mere, A., Altosaar, M., Raudoja, J., Mellikov, E. Phase composition of selenized Cu2ZnSnSe4 thin films determined by X-ray diffraction and Raman spectroscopy // Thin solid films (2011) Vol. 519, 21, p. 7394-7398 : ill.