Block-level fault model-free debug and diagnosis in digital systems
author
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
statement of authorship
R.Ubar, S.Kostin, J.Raik
source
Proceedings of the 12th EUROMICRO Conference on Digital System Design, Architectures, Methods and Tools : Patras, Greece, August 27-29, 2009
location of publication
Los Alamitos
publisher
IEEE
year of publication
2009
pages
p. 229-232
url
https://ieeexplore.ieee.org/document/5350128
subject term
digitaalseadmed
diagnostika (tehnika)
vead
ISBN
978-0-7695-3782-5
notes
Bibliogr.: 9 ref
language
inglise