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Enhancing transmission line reliability : an AI-driven approach to fault identification and classification

author
Shabbir, Noman
Kamran, Daniel
Raja, Hadi Ashraf
source
Electronics
publisher
MDPI
year of publication
2024
subject term
tehisintellekt
rikked
ISSN
2079-9292
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
1.1
TalTech department
Targa linna tippkeskus
elektroenergeetika ja mehhatroonika instituut
language
inglise
Qadar, R. M. A., Habib, K., Khan, R., Daniel, K., Raja, H. A., Shabbir, N. Enhancing transmission line reliability : an AI-driven approach to fault identification and classification // Electronics (2024)