Characterization of deep level traps in semiconductor structures using numerical experiments
author
Koel, Ants
Rang, Toomas
Rang, Galina
statement of authorship
A. Koel, T. Rang & G. Rang
source
Materials characterization VII
location of publication
Southampton
publisher
WIT Press
year of publication
2015
pages
p. 253-261 : ill
series
WIT transactions on engineering sciences ; 90
subject term
pooljuhtdioodid
galliumarseniid
matemaatilised mudelid
spektroskoopia
keyword
numerical simulation
deep level traps
GaAs PiN diode
ISSN
1746-4471
ISBN
978-1-84564-948-7
notes
Bibliogr.: 3 ref
TTÜ department
Thomas Johann Seebecki elektroonikainstituut
language
inglise