Machine learning enabled fault-detection algorithms for optical spectrum-as-a-service users
author
Patri, Sai Kireet
Dick, Isabella
Kaeval, Kaida
Müller, Jasper
Pedreno-Manresa, Jose-Juan
Autenrieth, Achim
Elbers, Jörg-Peter
Tikas, Marko
Mas-Machuca, Carmen
statement of authorship
Sai Kireet Patri, Isabella Dick, Kaida Kaeval, Jasper Müller, Jose-Juan Pedreno-Manresa, Achim Autenrieth, Jörg-Peter Elbers, Marko Tikas, Carmen Mas-Machuca
source
2023 International Conference on Optical Network Design and Modeling (ONDM) : proceedings
publisher
IEEE
year of publication
2023
pages
6 p. : ill
conference name, date
International Conference on Optical Network Design and Modeling (ONDM), May 8-11, 2023
conference location
Coimbra, Portugal
url
https://ieeexplore.ieee.org/document/10144858
subject term
tehisõpe
vead
optiline andmeside
Scopus
Scopus
keyword
optical spectrum-as-a-service
optical networks
network monitoring
fault detection
machine learning (ML)
ISBN
978-3-903176-54-6
notes
Bibliogr.: 14 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise