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Modeling soft-error reliability under variability

author
statement of authorship
Aneesh Balakrishnan; Guilherme Cardoso Medeiros; Cemil Cem Gürsoy; Said Hamdioui; Maksim Jenihhin; Dan Alexandrescu
source
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
publisher
year of publication
pages
p. 1-6
conference name, date
2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021
url
ISSN
2765-933X
ISBN
978-1-6654-1609-2
notes
Bibliogr.: 19 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Balakrishnan, A., Medeiros, G.C., Gürsoy, C.C., Hamdioui, S., Jenihhin, M., Alexandrescu, D. Modeling soft-error reliability under variability // 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) : 6-8 Oct. 2021. : IEEE, 2021. p. 1-6. https://doi.org/10.1109/DFT52944.2021.9568295