Distributed approach for genetic test generation in the field of digital electronics
author
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Eero Ivask, Jaan Raik and Raimund Ubar
source
Intelligent Distributed Computing, Systems and Applications : proceedings of the 2nd International Symposium on Intelligent Distributed Computing : IDC 2008 : Catania, Italy, 2008
location of publication
[S.l.]
publisher
Springer
year of publication
2008
pages
p. 127-136
subject term
digitaalelektroonika
ISBN
978-3-540-8525-8
notes
(Studies in computational intelligence ; 162)
language
inglise