Testability-based parameter measurement of analog measuring circuits in the frequency domain
author
Liu, Ji-Gou
Frühauf, Uwe
statement of authorship
Ji-Gou Liu and Uwe Frühauf
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 329-332: ill
ISBN
9985-59-081-3
notes
Bibl. 8 ref