At-speed on-chip diagnosis of board-level interconnect faults

author
statement of authorship
Artur Jutman
source
Ninth IEEE European Test Symposium : ETS 2004 : 23-26 May 2004, Corsica, France : proceedings
location of publication
Los Alamitos
publisher
year of publication
pages
p. 2-7 : ill
ISBN
0-7695-2119-3
notes
Bibliogr.: 15 ref. Saadaval ka CD-ROMil
language
inglise