Reliability analysis of micro-inverters considering PV module variations and degradation rates
author
Liivik, Elizaveta
Sangwongwanich, Ariya
Blaabjerg, Frede
statement of authorship
Elizaveta Liivik, Ariya Sangwongwanich, and Frede Blaabjerg
source
2018 20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe) : Riga, Latvia, 17-21 September 2018
location of publication
Red Hook
publisher
IEEE
year of publication
2018
pages
p. 1475-1482 : ill
conference name, date
20th European Conference on Power Electronics and Applications (EPE'18 ECCE Europe), 17-21 September 2018
conference location
Riga, Latvia
url
https://ieeexplore.ieee.org/document/8515325
subject term
päikeseelemendid
inverterid
keyword
reliability
mission profile
photovoltaic
power semiconductor device
thermal stress
ISBN
978-1-5386-4145-3
notes
Bibliogr.: 17 ref
TalTech department
elektroenergeetika ja mehhatroonika instituut
language
inglise