Determining a device crossover point in CPU/GPU systems for streaming applications
author                    
                    
                
statement of authorship                    
                    
Sudeep Kanur, Wictor Lund, Leonidas Tsiopoulos, Johan Lilius
                            
                    
source                    
                    
2015 IEEE Global Conference on Signal and Information Processing : GlobalSIP 2015 : Orlando, FL, USA, December 14-16, 2015
                            
                    
location of publication                    
                    
[S.l.]
                            
                    
publisher                    
                    
                
year of publication                    
                    
                
pages                    
                    
p. 1417-1421 : ill
                            
                    
conference name, date                    
                    
3rd IEEE Global Conference on Signal and Information Processing (GlobalSIP 2015), December 14-16, 2015
                            
                    
conference location                    
                    
Orlando, Florida, USA
                            
                    
subject term                    
                    
                
ISBN                    
                    
978-1-4799-7591-4
                            
                    
notes                    
                    
Bibliogr.: 15 ref
                            
                    
TalTech department                    
                    
                
language                    
                    
inglise
                            
                    
                            Kanur, S., Lund, W., Tsiopoulos, L., Lilius, J. Determining a device crossover point in CPU/GPU systems for streaming applications // 2015 IEEE Global Conference on Signal and Information Processing : GlobalSIP 2015 : Orlando, FL, USA, December 14-16, 2015. [S.l.] : IEEE, 2015. p. 1417-1421 : ill.