BASTION : board and SoC test instrumentation for ageing and no failure found
author
Jutman, Artur
Lotz, Christophe
Larsson, Erik
Sonza Reorda, Matteo
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Artur Jutman, Christophe Lotz, Erik Larsson, Matteo Sonza Reorda, Maksim Jenihhin, Jaan Raik, Hans Kerkhoff, Rene Krenz-Baath, and Piet Engelke
source
Proceedings of the 2017 Design, Automation & Test in Europe (DATE) : 27-31 March 2017, Swisstech, Lausanne, Switzerland
location of publication
[S.l.]
publisher
IEEE
year of publication
2017
pages
p. 115-120 : ill
conference name, date
2017 Design, Automation & Test in Europe (DATE), 27-31 March, 2017
conference location
Lausanne, Switzerland
url
https://doi.org/10.23919/DATE.2017.7926968
subject term
elektroonikakomponendid
rikked
diagnostika (tehnika)
koostööprojektid
rahvusvaheline koostöö
keyword
No-Fault-Found
No-Trouble-Found
aging
embedded instruments
IEEE 1687
IJTAG
ISSN
1558-1101
ISBN
978-3-9815370-8-6
notes
Bibliogr. p. 119-120
TTÜ department
arvutisüsteemide instituut
language
inglise