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Analyzing side-channel attack vulnerabilities at RTL

author
Lai, Xinhui
Jenihhin, Maksim
statement of authorship
Xinhui Lai, Maksim Jenihhin
source
2023 IEEE 24th Latin American Test Symposium (LATS)
publisher
IEEE
year of publication
2023
pages
2 p. : ill
conference name, date
2023 IEEE 24th Latin American Test Symposium (LATS) : 21-24 March 2023
conference location
Veracruz, Mexico
url
https://doi.org/10.1109/LATS58125.2023.10154497
subject term
haavatavus
integraallülitused
autentimine
keyword
Authentication
Side-channel attacks
Physical unclonable function
Timing
Security
ISBN
979-8-3503-2597-3
notes
Bibliogr.: 10 ref
TTÜ department
arvutisüsteemide instituut
language
inglise
Lai, X., Jenihhin, M. Analyzing side-channel attack vulnerabilities at RTL // 2023 IEEE 24th Latin American Test Symposium (LATS). : IEEE, 2023. 2 p. : ill. https://doi.org/10.1109/LATS58125.2023.10154497