Analyzing side-channel attack vulnerabilities at RTL
author
statement of authorship
Xinhui Lai, Maksim Jenihhin
source
2023 IEEE 24th Latin American Test Symposium (LATS)
publisher
year of publication
pages
2 p. : ill
conference name, date
2023 IEEE 24th Latin American Test Symposium (LATS) : 21-24 March 2023
conference location
Veracruz, Mexico
ISBN
979-8-3503-2597-3
notes
Bibliogr.: 10 ref
TTÜ department
language
inglise
Lai, X., Jenihhin, M. Analyzing side-channel attack vulnerabilities at RTL // 2023 IEEE 24th Latin American Test Symposium (LATS). : IEEE, 2023. 2 p. : ill.