Active redundancy in fault tolerance : A modular switch level solution with synchronous switching
statement of authorship
Aditya Shirodkar, Satish Naik Banavath, Andrii Chub, Riccardo Mandrioli, Mattia Ricco
publisher
year of publication
pages
6 p
conference name, date
7th IEEE International Conference on DC Microgrids (ICDCM 2025), June 4 - 6, 2025
conference location
Tallinn, Estonia
subject term
Scopus
ISBN
9798331512743
scientific publication
teaduspublikatsioon
classifier
TalTech department
language
inglise
Shirodkar, A., Banavath, S. N., Chub, A., Mandrioli, R., Ricco, M. Active redundancy in fault tolerance : A modular switch level solution with synchronous switching // 2025 IEEE Seventh International Conference on DC Microgrids (ICDCM). : IEEE, 2025. 6 p.