Top-K formal concepts for identifying positively and negatively correlated biclusters

statement of authorship
Amina Houari & Sadok Ben Yahia
location of publication
Cham
publisher
year of publication
pages
p. 156-172
conference name, date
10th International Conference, MEDI 2021, Tallinn, Estonia, June 21-23, 2021
conference location
Virtual Conference
kvartiil
Q3
category (general)
ISSN
0302-9743
1611-3349
ISBN
978-3-030-78427-0
978-3-030-78428-7
scientific publication
teaduspublikatsioon
classifier
3.1
TTÜ department
language
inglise
Uurimisrühm
Houari, A., Ben Yahia, S. Top-K formal concepts for identifying positively and negatively correlated biclusters // Model and Data Engineering : 10th International Conference, MEDI 2021, Tallinn, Estonia, June 21–23, 2021 : proceedings. Cham : Springer Nature, 2021. p. 156-172. (Lecture notes in computer science ; 12732). https://doi.org/10.1007/978-3-030-78428-7_13