The dependence of reverse recovery time on barrier capacitance and series on-resistance in Schottky diodes
author
Veher, Oleksandr
Sleptšuk, Natalja
Toompuu, Jana
Korolkov, Oleg
Rang, Toomas
statement of authorship
Oleksandr Veher, Natalja Sleptsuk, Jana Toompuu, Oleg Korolkov & Toomas Rang
source
Materials and contact characterisation VIII
location of publication
Southampton
publisher
WIT Press
year of publication
2017
pages
p. 15-22 : ill
series
WIT transactions on engineering sciences ; 116
conference name, date
8th International Conference on Computational Methods and Experiments in Materials Characterisation, 21-23 June, 2017
conference location
Tallinn, Estonia
url
https://doi.org/10.2495/MC170021
subject term
dioodid
pooljuhtseadised
Schottky barjäär
mahtuvus (elektrotehnika)
takistusjõud
Scopus
https://www.scopus.com/sourceid/6000195382
https://www.scopus.com/record/display.uri?eid=2-s2.0-85039048136&origin=inward&txGid=4faea48be3ad1b3d32945f9ba70be5f6
quartile
Q4
category (general)
Engineering
Tehnika
Chemical engineering
Keemiatehnoloogia
Materials science
Materjaliteadus
Chemistry
Keemia
category (sub)
Engineering. Computational mechanics
Tehnika. Arvutusmehaanika
Chemical engineering. Fluid flow and transfer processes
Keemiatehnoloogia. Vedeliku voolu- ja ülekandeprotsessid
Engineering. Mechanics of materials
Tehnika. Materjalide mehaanika
Materials science. General materials science
Materjaliteadus. Üldine materjaliteadus
Chemistry. Electrochemistry
Keemia. Elektrokeemia
keyword
reverse recovery time
Schottky diodes
barrier capacitance
series-on resistance
ISSN
1746-4471
ISBN
978-1-78466-197-7
notes
Bibliogr.: 4 ref
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
Thomas Johann Seebecki elektroonikainstituut
language
inglise