Embedded instrumentation toolbox for screening marginal defects and outliers for production
author
Odintsov, Sergei
Jutman, Artur
Devadze, Sergei
Aleksejev, Igor
statement of authorship
Sergei Odintsov, Artur Jutman, Sergei Devadze, Igor Aleksejev
source
IEEE AUTOTESTCON 2017 : Schaumburg, USA, Sept 11-14, 2017 : proceedings
location of publication
Piscataway
publisher
IEEE
year of publication
2017
pages
p. 336-334 : ill
conference name, date
IEEE AUTOTESTCON 2017, September 11-14, 2017
conference location
Schaumburg, USA
url
https://doi.org/10.1109/AUTEST.2017.8080516
subject term
diagnostika (tehnika)
tarkvara projekteerimine
TalTech subject term
sardkontroller
keyword
operating margin
marginal defect
no fault found
NFF
FPGA-centric test
embedded instruments
high-speed serial link test
memory interconnect test
bit-error rate test
DDR4 interconnect test
ISBN
978-1-5090-4922-6
notes
Bibliogr.: 15 ref
TalTech department
arvutisüsteemide instituut
language
inglise