Defect oriented fault coverage of 100stuck-at fault test sets
author
Blyzniuk, M.
Cibakova, Tatiana
Gramatova, Elena
Kuzmicz, W.
Lobur, M.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
M.Blyzniuk, T.Cibakova, E.Gramatova, W.Kuzmicz, M.Lobur, W.Pleskacz, J.Raik, R.Ubar
source
Proceedings of the 7th International Conference Mixed Design of Integrated Circuits and Systems : MIXDES 2000 : Gdynia, Poland, 15-17 June 2000
location of publication
[S. l.]
year of publication
2000
pages
p. 511-516 : ill
ISBN
83-87202-37-1
notes
Bibliogr.: 12 ref