Hierarchical defect-oriented fault simulation for digital circuits
author
Blyzniuk, M.
Cibakova, Tatiana
Gramatova, Elena
Kuzmicz, W.
Lobur, M.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
M.Blyzniuk, T.Cibakova, E.Gramatova, W.Kuzmicz, M.Lobur, W.Pleskacz, J.Raik, R.Ubar
source
IEEE European Test Workshop
location of publication
Cascais
year of publication
2000
pages
p. 151-156
url
https://ieeexplore.ieee.org/document/873781
subject term
elektriahelad
defektid
simulatsioon
language
inglise