Detection efficiency calibration of Si-SPAD detectors via comparison with a Si-standard diode
statement of authorship
Dhoska, K., Hofer, H., López, M., Rodiek, B., Kübarsepp, T. & Kück, S.
location of publication
Tallinn
publisher
year of publication
pages
p. 110-115 : ill
conference name, date
11h International Conference of DAAAM Baltic Industrial Engineering, 20-22 April, 2016
conference location
Tallinn, Estonia
subject term
ISSN
2346-612X
ISBN
978-9949-23-987-0
notes
Bibliogr.: 6 ref
TTÜ department
language
inglise
Dhoska, K., Hofer, H., Lopez, M., Rodiek, B., Kübarsepp, T., Kück, S. Detection efficiency calibration of Si-SPAD detectors via comparison with a Si-standard diode // Proceedings of the 11th International Conference of DAAAM Baltic Industrial Engineering : 20-22th April 2016, Tallinn, Estonia. Tallinn : Tallinn University of Technology, 2016. p. 110-115 : ill.