Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interface

statement of authorship
D.Kropman, E.Mellikov, K.Lott, T.Kärner, I.Heinmaa, T.Laas, A.Medvid, W.Skroupa, S.Prucnal, S.Zvyagin, E.Cizmar, M.Ozerov, J.Wosnitsa
journal volume number month
Vol. 156/158
year of publication
pages
p. 145-148 : ill
ISSN
1012-0394
notes
Bibliogr.: 3 ref
language
inglise