Interaction of point defects with impurities in the Si-SiO2 system and its influence on the properties of the interface
author
Kropman, Daniel
Mellikov, Enn
Lott, Kalju
Kärner, T.
Heinmaa, I.
Laas, Tõnu
Medvid, A.
Skroupa, W.
Prucnal, S.
Zvyagin, S.
Cizmar, E.
Ozerov, M.
Wosnitsa, J.
statement of authorship
D.Kropman, E.Mellikov, K.Lott, T.Kärner, I.Heinmaa, T.Laas, A.Medvid, W.Skroupa, S.Prucnal, S.Zvyagin, E.Cizmar, M.Ozerov, J.Wosnitsa
source
Solid state phenomena
journal volume number month
Vol. 156/158
year of publication
2010
pages
p. 145-148 : ill
url
https://www.sciencedirect.com/science/article/abs/pii/S0040609009014564
subject term
õhukesed kiled
tuumamagnetresonants
magnetresonants
ISSN
1012-0394
notes
Bibliogr.: 3 ref
language
inglise