On-chip sensors data collection and analysis for SoC health management
author
Shibin, Konstantin
Jenihhin, Maksim
Jutman, Artur
Devadze, Sergei
Tsertov, Anton
statement of authorship
Konstantin Shibin, Maksim Jenihhin, Artur Jutman, Sergei Devadze, Anton Tsertov
source
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
publisher
IEEE
year of publication
2023
pages
6 p
conference name, date
36th IEEE InternationalSymposium on Defect andFault Tolerancein VLSIandNanotechnology Systems (DFT), 3-5 October 2023
conference location
Juan-les-Pins, France
url
https://doi.org/10.1109/DFT59622.2023.10313562
subject term
kiipvõrgud
rikked
veakindlus
algoritmid
keyword
SOC
modern system-on-chips (SoCs)
multi-processor system-on-chips (MPSoCs)
on-chip sensor
health management
fault management
health map
self-awareness
ISSN
2765-933X
ISBN
979-8-3503-1500-4
notes
Bibliogr.: 15 ref
scientific publication
teaduspublikatsioon
classifier
1.1
TalTech department
arvutisüsteemide instituut
language
inglise