Gate-level modelling of NBTI-induced delays under process variations
author
Copetti, Thiago
Cardoso Medeiros, Guilherme
Bolzani Poehls, Leticia
Vargas, Fabian
Kostin, Sergei
Jenihhin, Maksim
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Thiago Copetti, Guilherme Medeiros, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar
source
LATS 2016 : 17th IEEE Latin-American Test Symposium, Foz do Iguacu, Brazil, 6th-9th April 2016
location of publication
[S.l.]
publisher
IEEE
year of publication
2016
pages
p. 75-80 : ill
conference name, date
17th Latin-American Test Symposium, 6-9 April, 2016
conference location
Foz do Iguacu, Brazil
url
http://dx.doi.org/10.1109/LATW.2016.7483343
subject term
integraallülitused
elutsüklid (tehnika)
keyword
reliability
NBTI
PV
static timing analysis
aging
SPICE
ISBN
978-1-5090-1331-9
notes
Bibliogr.: 20 ref
TTÜ department
arvutitehnika instituut
language
inglise