A two-phase metamorphic approach for testing industrial control systems
author
statement of authorship
Gaadha Sudheerbabu, Tanwir Ahmad, Filip Sebek, Dragos Truscan, Jüri Vain, Ivan Porres
source
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) : proceedings
publisher
year of publication
pages
4 p
conference name, date
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA), 6-9 Sept. 2022
conference location
Stuttgart, Germany
notes
Bibliogr.: 9 ref
Open Access
Open Access (roheline)
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
subject term
keyword
metamorphic testing
classifier
Reserch Group
Sudheerbabu, Gaadha; Ahmad, Tanwir; Sebek, Filip; Truscan, Dragos; Vain, Jüri;Porres, Ivan A two-phase metamorphic approach for testing industrial control systems // 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA) : proceedings. : IEEE, 2022. 4 p.