Pattern based analysis of fractal manufacturing systems [Electronic resource]
author
Jääger, Kadi
Vain, Jüri
statement of authorship
K. Jääger, J. Vain
source
INCOM 2004 : 11th IFAC Symposium on Information Control Problems in Manufacturing : Salvador, Brasil, April 5-7, 2004 : preprints proceedings
location of publication
[S.l.]
publisher
Gulf Professional Publishing
year of publication
2005
pages
[6] p. [CD-ROM]
conference name, date
11th IFAC Symposium on Information Control Problems in Manufacturing, April 5-7, 2004
conference location
Salvador, Brasil
url
https://www.sciencedirect.com/science/article/pii/S1474667017361529
subject term
tootmissüsteemid
mudelid
kontroll
analüüs
language
inglise