Design error localization in digital circuits by stuck-at fault test patterns
author
Jutman, Artur
Ubar, Raimund-Johannes
statement of authorship
A.Jutman, R.Ubar
source
[MIEL] 2000 : 22nd International Conference on Microelectronics : Niš, Yugoslavia, 14-17 May 2000 : proceedings. Volume 2
location of publication
[S. l.]
publisher
Electron Devices Society
year of publication
2000
pages
p. 723-726
url
https://ieeexplore.ieee.org/document/838792
subject term
disain
vead
testid
rikked
ISBN
0-7803-5235-1
notes
Bibliogr.: 10 ref
language
inglise