Metamorphic testing for verification and fault localization in industrial control systems

statement of authorship
Gaadha Sudheerbabu, Tanwir Ahmad, Dragos Truscan and Jüri Vain
location of publication
Cham
publisher
year of publication
pages
p. 127 - 159
keyword
safety and security testing
spectrum-based fault localization
ISBN
978-303142212-6
978-303142211-9
notes
Bibliogr.: 46 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
language
inglise
Sudheerbabu, G., Ahmad, T., Truscan, D., Vain, J. Metamorphic testing for verification and fault localization in industrial control systems // CyberSecurity in a DevOps Environment: From Requirements to Monitoring. Cham : Springer Nature, 2023. p. 127 - 159. https://doi.org/10.1007/978-3-031-42212-6_5