Measurements of charge carrier lifetime temperature dependence in 4H-SiC power diodes
author
statement of authorship
Enn Velmre, Andres Udal
location of publication
[S.l.]
year of publication
pages
paper no 394, 2 p
language
inglise
subject term
Velmre, E., Udal, A. Measurements of charge carrier lifetime temperature dependence in 4H-SiC power diodes // Abstracts of International Conference on Silicon Carbide and Related Materials : ICSCRM'99 : October 10-15, 1999, Research Triangle Park, North-Carolina, USA. [S.l.], 1999. paper no 394, 2 p.