Accurate NBTI-induced gate delay modeling based on intensive SPICE simulations
author
Kostin, Sergei
Raik, Jaan
Ubar, Raimund-Johannes
Jenihhin, Maksim
statement of authorship
Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, ... [et al.]
source
MEDIAN Finale : Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : November 10-11, 2015, Tallinn, Estonia
location of publication
[S.l.]
publisher
COST
year of publication
2015
pages
p. 21-26 : ill
conference name, date
Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, MEDIAN Finale, November 10-11, 2015
conference location
Tallinn, Estonia
subject term
transistorid
pooljuhtseadised
materjalide vananemine
kompuutermodelleerimine
kompuutersimulatsioon
keyword
Negative Bias Temperature Instability (NBTI)
aging
gate delay
predictive model
SPICE
notes
Bibliogr.: 15 ref
TalTech department
arvutitehnika instituut
language
inglise