Analysis and improvement of resilience for long short-term memory neural networks
author
Ahmadilivani, Mohammad Hasan
Raik, Jaan
Daneshtalab, Masoud
Kuusik, Alar
statement of authorship
Mohammad Hasan Ahmadilivani, Jaan Raik, Masoud Daneshtalab, Alar Kuusik
source
2023 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT)
publisher
IEEE
year of publication
2023
pages
4 p
conference name, date
36th IEEE InternationalSymposium on Defect andFault Tolerancein VLSIandNanotechnology Systems (DFT), 3-5 October 2023
conference location
Juan-les-Pins, France
url
https://doi.org/10.1109/DFT59622.2023.10313559
subject term
rikked
veakindlus
tehisnärvivõrgud
Fourier' teisendus
meditsiin
lühiajaline mälu
nanotehnoloogia
keyword
fault tolerance
fault tolerant systems
discrete Fourier transforms
medical services
very large scale integration
long short term memory
nanotechnology
ISSN
2765-933X
ISBN
979-8-3503-1500-4
notes
Bibliogr.: 12 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise