Jutman, A., Pleskacz, W., Boiko, N., Ubar, R.-J.

full record print

DefSim-based exercises for studying defects in CMOS gates

author

Jutman, Artur

Pleskacz, Witold A.

Boiko, Nikolai

Ubar, Raimund-Johannes

statement of authorship

Artur Jutman, Witold Pleskacz, Nikolai Boiko, Raimund Ubar

source

EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden

location of publication

Stockholm

publisher

Royal Institute of Technology

year of publication

2006

pages

p. 23-26 : ill

ISBN

91-7178-402-0

notes

Bibliogr.: 8 ref

Jutman, A., Pleskacz, W., Boiko, N., Ubar, R.-J. DefSim-based exercises for studying defects in CMOS gates // EWME 2006 proceedings : 6th International Workshop on Microelectronics Education : 8-9 June, 2006, Stockholm, Sweden. Stockholm : Royal Institute of Technology, 2006. p. 23-26 : ill.