Measuring and identifying aging-critical paths in FPGAs
author
Pfeifer, Petr
Raik, Jaan
Jenihhin, Maksim
Ubar, Raimund-Johannes
Pliva, Zdenek
statement of authorship
Petr Pfeifer, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Zdenek Pliva
source
MEDIAN 2015 : the 4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale : March 13, 2015, Grenoble, France
location of publication
[S.l.]
publisher
COST
year of publication
2015
pages
p. 56-61 : ill
conference name, date
4th Workshop on Manufacturable and Dependable Multicore Architectures at Nanoscale, March 13, 2015
conference location
Grenoble, France
subject term
väliprogrammeeritav loogika
diagnostika (tehnika)
keyword
aging
FPGA
critical path
logic
LUT
BRAM
notes
Bibliogr.: 14 ref
TalTech department
arvutitehnika instituut
language
inglise