Failure prediction of power devices under reverse surge current conditions
author
Freidin, Boris
Velmre, Enn
Udal, Andres
statement of authorship
Boris Freydin, Enn Velmre, and Andres Udal
source
ISPSD’92 : Proceedings of the 4th International Symposium on Power Semiconductor Devices & Ics, Waseda University, Tokyo, Japan, 19-21 May 1992
location of publication
Tokyo
publisher
IEEE
year of publication
1992
pages
p. 118-123: fig
conference name, date
The 4th International Symposium on Power Semiconductor Devices, May 1992
conference location
Waseda University, Tokyo
url
https://doi.org//10.1109/ISPSD.1992.991247
subject term
pooljuhtseadised
jõuseadised
töökindlus
keyword
Surges
Temperature dependence
Poisson equations
Nonlinear equations
Doping
Electronic packaging thermal management
Semiconductor device packaging
Semiconductor devices
Semiconductor diodes
Charge carrier processes