APPRAISER : DNN fault resilience analysis employing approximation errors
author
Taheri, Mahdi
Ahmadilivani, Mohammad Hasan
Jenihhin, Maksim
Raik, Jaan
Daneshtalab, Masoud
statement of authorship
Mahdi Taheri, Mohammad Hasan Ahmadilivani, Maksim Jenihhin, Jaan Raik, Masoud Daneshtalab
source
2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS)
location of publication
Piscataway, New Jersey
publisher
IEEE
year of publication
2023
pages
p. 124−127
conference name, date
26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, May 3-5, 2023
conference location
Tallinn
url
https://ddecs2023.taltech.ee/
https://doi.org//10.1109/DDECS57882.2023.10139468
subject term
arvutisüsteemid
riistvara
tõrketaluvus
keyword
Deep learning
Emulation
Approximate computing
Neural networks
Reliability engineering
Hardware
Circuit faults
ISSN
2473-2117
ISBN
979-8-3503-3277-3
notes
Allikas ka: 2023 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems (DDECS), Tallinn, Estonia, 2023
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise