Metrology for industrial quantum communications : the MIQC project
author
Rastello, Maria Luisa
Degiovanni, I. P.
Kübarsepp, Toomas
statement of authorship
M.L. Rastello, I.P. Degiovanni, ... T. Kubarsepp, ... [et al.]
source
Metrologia
journal volume number month
Vol. 51, 6
year of publication
2014
pages
p. S267-S275 : ill
subject term
metroloogia
kvantkrüptograafia
kvantinformatsioon
keyword
metrology
quantum cryptography
quantum communication
ISSN
0026-1394
notes
Bibliogr.: 29 ref
TalTech department
mehhatroonikainstituut
language
inglise