At-speed functional built-in self-test methodology for processors [Electronic resource]
author
Ubar, Raimund-Johannes
Indus, Viljar
Kalmend, Oliver
statement of authorship
Raimund Ubar, Viljar Indus, Oliver Kalmend
source
Proceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka
location of publication
[S.l.]
publisher
IASTED
year of publication
2012
pages
p. 168-172 : ill [CD-ROM]
series
A publication of the international Association of Science and Technology for Development ; 785
conference name, date
IASTED International Conference on Engineering and Applied Science, December 27-29, 2012
conference location
Columbo, Sri Lanka
subject term
protsessorid
testimine
keyword
processor testing
functional self-test
test generation
ISBN
978-0-88986-941-7
notes
Bibliogr.: 18 ref
TTÜ department
arvutitehnika instituut
language
inglise