Untestable fault identification in sequential circuits using model-checking
author
Raik, Jaan
Fujiwara, Hideo
Ubar, Raimund-Johannes
Krivenko, Anna
statement of authorship
Jaan Raik, Hideo Fujiwara, Raimund Ubar, Anna Krivenko
source
2002-2011 : 20th Anniversary compendium of papers from Asian Test Symposium
location of publication
Kolkata
publisher
IEEE
year of publication
2011
pages
p. 257-262 : ill
url
https://ieeexplore.ieee.org/document/4711554
subject term
elektriahelad
rikked
diagnostika (tehnika)
järjendanalüüs
ISBN
978-93-80813-12-7
notes
Bibliogr.: 11 ref
language
inglise