High temperature investigation of ZnS:Ga and CdSe:Ga

statement of authorship
K.Lott, T.Nirk, O.Volobujeva, S.Šinkarenko, L.Türn, U.Kallavus, A.Grebennik, A.Vishnjakov, A.
source
journal volume number month
376/377
year of publication
pages
Proceedings of the 23rd International Conference on Defects in Semiconductors : ICDS-23 : held in Awaji Island, Japan, 24-29 July, 2005. p. 764-766 : ill
ISSN
0921-4526
notes
Bibliogr.: 13 ref
language
inglise