Virtual reconfigurable scan-chains on FPGAs for optimized board test
statement of authorship
Igor Aleksejev, Sergei Devadze, Artur Jutman, Konstantin Shibin
source
location of publication
[S.l.]
publisher
year of publication
pages
[6] p. : ill
conference name, date
16th Latin American Test Symposium, 25-27 March, 2015
conference location
Puerto Vallarta, Mexico
subject term
ISSN
2373-0862
ISBN
978-1-4673-6711-0
notes
Bibliogr.: 13 ref
TTÜ department
language
inglise
Aleksejev, I., Jutman, A., Devadze, S., Shibin, K. Virtual reconfigurable scan-chains on FPGAs for optimized board test // 2015 16th Latin American Test Symposium (LATS 2015) : Puerto Vallarta, Mexico, 25-27 March 2015. [S.l.] : IEEE, 2015. [6] p. : ill.