Effect of ultrasonic treatment on the defect structure of the Si-SiO2 system
author
Kropman, Daniel
Seeman, Viktor
Dolgov, Sergei
Medvids, Arturs
statement of authorship
D. Kropman, V. Seeman, S. Dolgov, A. Medvids
source
Physica Status Solidi (C) Current Topics in Solid State Physics
publisher
Wiley-VCH
journal volume number month
vol. 13, 10-12
year of publication
2016
pages
p. 793 - 797
url
https://doi.org/10.1002/pssc.201600052
subject term
ultrahelitöötlus
ränidioksiid
metalloksiidid
liidesed
diagnostika (tehnika)
defektoskoopia
keyword
defect structure
ESR
Si-SiO2 interface
ultrasonic treatment
ISSN
1862-6351
notes
Bibliogr.: 14 ref
scientific publication
teaduspublikatsioon
classifier
1.1
Scopus
https://www.scopus.com/sourceid/4700152710
https://www.scopus.com/record/display.uri?eid=2-s2.0-84992646936&origin=resultslist&sort=plf-f&src=s&sid=50973f8aeb3d1c19e096d56f835e7904&sot=b&sdt=b&s=DOI%2810.1002%2Fpssc.201600052%29&sl=35&sessionSearchId=50973f8aeb3d1c19e096d56f835e7904&relpos=0
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:000399448900018
category (general)
Physics and astronomy
Füüsika ja astronoomia
category (sub)
Physics and astronomy. Condensed matter physics
Füüsika ja astronoomia. Kondenseeritud aine füüsika
quartile
Q3
TalTech department
materjali- ja keskkonnatehnoloogia instituut
language
inglise