Comparison of two approaches to improve functional BIST fault coverage
author
Kostin, Sergei
Ubar, Raimund-Johannes
Gorev, Maksim
Mägi, Gunnar
statement of authorship
Sergei Kostin, Raimund Ubar, Maksim Gorev, Gunnar Mägi
source
BEC 2014 : 2014 14th Biennial Baltic Electronics Conference : proceedings of the 14th Biennial Baltic Electronics Conference : Tallinn University of Technology, October 6-8, 2014, Tallinn, Estonia
location of publication
Tallinn
publisher
Tallinn University of Technology
year of publication
2014
pages
p. 105-108 : ill
conference name, date
2014 14th Biennial Baltic Electronics Conference, October 6-8, 2014
conference location
Tallinn University of Technology
subject term
digitaaltehnika
teimimine
keyword
functional BIST
hybrid BIST
design for testability
controllability
test point insertion
ISSN
1736-3705
ISBN
978-9949-23-672-5
notes
Bibliogr.: 26 ref
TalTech department
arvutitehnika instituut
language
inglise