High temperature investigation of ZnS:Ga and CdSe:Ga
statement of authorship
K.Lott, T.Nirk, O.Volobujeva, S.Shinkarenko, A.Grebennik and A.Vishnjakov
source
The 23rd International Conference on Defects in Semiconductors : ICDS-23 : Awaji island, Japan, July 24 - July 29, 2005 : program and abstracts
location of publication
[S. l.]
year of publication
pages
p. 210 : ill
subject term
notes
Bibliogr.: 2 ref
language
inglise
Lott, K., Nirk, T., Volobujeva, O., Šinkarenko, S., Grebennik, A., Vishnjakov, A. High temperature investigation of ZnS:Ga and CdSe:Ga // The 23rd International Conference on Defects in Semiconductors : ICDS-23 : Awaji island, Japan, July 24 - July 29, 2005 : program and abstracts. [S. l.], 2005. p. 210 : ill.