Correlation of the morphology and electrical conductivity in thin films of PEDT/PSS complex: an integrated meso-scale simulation study
author
Kaevand, Toomas
Kalda, Jaan
Kukk, Vello
Öpik, Andres
Lille, Ülo
statement of authorship
Toomas Kaevand, Jaan Kalda, Vello Kukk, Andres Öpik, Ülo Lille
source
Molecular simulation
journal volume number month
Vol. 37, 6
year of publication
2011
pages
p. 495-502 : ill
url
https://www.tandfonline.com/doi/abs/10.1080/08927022.2011.554549
subject term
õhukesed kiled
elektrijuhtivus
korrelatsioon (füüsika)
simulatsioon
morfoloogiline analüüs
keyword
conjugated poymer
meso-scale simulation
percolation
random resistor network
ISSN
0892-7022
notes
Bibliogr.: 24 ref
language
inglise