Nanoelectronics aging mitigation using SSBDD based techniques and dedicated sensors
author
Ubar, Raimund-Johannes
Vargas, Fabian
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Raimund Ubar, Fabian Luis Vargas, Maksim Jenihhin, Jaan Raik
source
MEDIAN Workshop on Circuit Reliability : Modeling and Monitoring, Rome, Italy, February 25, 2013
location of publication
[S.l.]
year of publication
2013
pages
[1] p
conference name, date
MEDIAN Workshop on Circuit Reliability: Modeling and Monitoring, February 25, 2013
conference location
Rome, Italy
subject term
nanoelektroonika
TTÜ department
arvutitehnika instituut
language
inglise