DSP-based electrical impedance tomography device: implementation and experiments

statement of authorship
Anar Abdullayev, Marek Rist, Margus Metshein, Olev Martens
source
2025 IEEE International Instrumentation and Measurement Technology Conference (I2MTC)
publisher
year of publication
pages
6 p
conference name, date
IEEE I2MTC – International Instrumentation and Measurement Technology Conference, 19-22 May 2025
conference location
Chemnitz, Germany
keyword
electrical impedance tomography (EIT)
ISSN
2642-2069
ISBN
979-8-3315-0501-1
scientific publication
teaduspublikatsioon
classifier
3.1
language
English
Inglise