Activity classification for real-time wearable systems : effect of window length, sampling frequency and number of features on classifier performance
statement of authorship                    
                    
Ardo Allik, Kristjan Pilt, Deniss Karai, Ivo Fridolin, Mairo Leier, Gert Jervan
                            
                    
location of publication                    
                    
[S.l.]
                            
                    
publisher                    
                    
                
year of publication                    
                    
                
pages                    
                    
p. 460-464 : ill
                            
                    
conference name, date                    
                    
2016 IEEE EMBS Conference on Biomedical Engineering and Sciences, 4-8 December, 2016
                            
                    
conference location                    
                    
Kuala Lumpur, Malaysia
                            
                    
subject term                    
                    
                
keyword                    
                    
sampling frequency
                            
                            
window length
                            
                            
classification features
                            
                            
                            
                    
ISBN                    
                    
978-1-4673-7791-1
                            
                    
notes                    
                    
Bibliogr.: 15 ref
                            
                    
TalTech department                    
                    
                
language                    
                    
inglise
                            
                    
                                    Allik, A., Pilt, K., Karai, D., Fridolin, I., Leier, M., Jervan, G. Activity classification for real-time wearable systems : effect of window length, sampling frequency and number of features on classifier performance // 2016 IEEE EMBS Conference on Biomedical Engineering and Sciences (IECBES) : Kuala Lumpur, 4-8 December 2016. [S.l.] : IEEE, 2016. p. 460-464 : ill.  https://doi.org/10.1109/IECBES.2016.7843493