Exploration of Activation Fault Reliability in Quantized Systolic Array-Based DNN Accelerators
author
Taheri, Mahdi
Cherezova, Natalia
Ansari, Mohammad Saeed
Jenihhin, Maksim
Mahani, Ali
Daneshtalab, Masoud
Raik, Jaan
statement of authorship
Mahdi Taheri, Natalia Cherezova, Mohammad Saeed Ansari, Maksim Jenihhin, Ali Mahani, Masoud Daneshtalab, Jaan Raik
source
25th International Symposium on Quality Electronic Design (ISQED)
publisher
IEEE
year of publication
2024
pages
8 p. : ill
conference name, date
25th International Symposium on Quality Electronic Design (ISQED), 3 April 2024 – 5 April 2024
conference location
San Francisco, California, United States
url
https://ieeexplore.ieee.org/stamp/stamp.jsp?arnumber=10528372
https://doi.org/10.1109/ISQED60706.2024.10528372
subject term
riistvara
rikked
tehisnärvivõrgud
tehisõpe
kiirendid
efektiivsus
töökindlus
Scopus
https://www.scopus.com/sourceid/21100205716
https://www.scopus.com/pages/publications/85192830380?inward
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:001229692400008
quartile
Q3
category (general)
Engineering
Tehnika
category (sub)
Engineering. Safety, risk, reliability and quality
Tehnika. Ohutus, risk, töökindlus ja kvaliteet
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
Computer science. Hardware and architecture
Arvutiteadus. Riistvara ja arhitektuur
keyword
deep neural networks
design space exploration
quantization
fault simulation
reliability assessment
ISBN
979-835030927-0
notes
Bibliogr.: 29 ref
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise